Suzuki Masane

发表

Automatic flatness tester for VLSI

Toyohiko Yatagai, Shigeru Inaba, Hideki Nakano, 1983 .

Automatic Flatness Tester For Very Large Scale Integrated Circuit Wafers

Toyohiko Yatagai, Shigeru Inaba, Hideki Nakano, 1984 .

Applications of Moiré topography measurement methods in industry

Motonori Kanaya, Suzuki Masane, 1988 .

Moiré topography using developed recording methods

Suzuki Masane, Kiyoshi Suzuki, Kiyoshi Suzuki, 1982 .