Kyu-Beom Kim

Impact of etch angles on cell characteristics in 3D NAND flash memory

Nguyen Van Toan, Takahito Ono, Kyu-Beom Kim, 2018, Microelectron. J..

The threshold voltage fluctuation of one memory cell for the scaling-down NOR flash

Yunheub Song, Hyungjun Yang, Hojoong An, 2010, 2010 2nd IEEE InternationalConference on Network Infrastructure and Digital Content.