Xiaozong Huang

A New High Holding Voltage Dual-Direction SCR With Optimized Segmented Topology

Hui Cheng, Juin J. Liou, Jizhi Liu, 2016, IEEE Electron Device Letters.

Failure analysis of a PLL ESD structure design defect

Chenyue Ma, Xinnan Lin, Zhiwei Liu, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

The segmented SCRs with optimized holding voltage for on-chip ESD protection

Chenyue Ma, Xinnan Lin, Jizhi Liu, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).