Yoshihiro Ohtsu

Basal Plane Dislocation Analysis of 4H-SiC Using Multi Directional STEM Observation

T. Isshiki, Y. Orai, Takahiro Sato, 2015 .

High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope

K. Kaji, Koichiro Saito, T. Hashimoto, 2015 .