B. Pécz

Structural and electrical correlation in aluminum nitride thin films grown by plasma enhanced atomic layer deposition as interface insulating layers on silicon carbide (4H-SiC)

Z. Fogarassy, C. Bongiorno, F. Giannazzo, 2023, Microelectronic Engineering.

Integration of graphene and MoS2 on silicon carbide: Materials science challenges and novel devices

F. Giannazzo, E. Schilirò, S. Panasci, 2024, Materials Science in Semiconductor Processing.

Atomic layer deposited Fe-sulphide layers with pyrrhotite structure controlled by the deposition temperature

Z. Fogarassy, Z. Baji, I. Cora, 2024, Thin Solid Films.