John A. Davies

Single Event Upset (SEU) testing of semiconductor components at the McMaster Accelerator Laboratory

John P. W. Stark, John A. Davies, F.J.D. Almeida, 1991 .

Conditions for absolute instability in the cyclotron resonance maser

John A. Davies, 1989 .

A multidimensional inverse problem in transport theory

John A. Davies, Madhoo Kanal, 1979 .