T.-Y Yew

Re-investigating the adequacy of projecting ring oscillator frequency shift from device level degradation

K. Wu, Y.-H Lee, W. Wang, 2014, 2014 IEEE International Reliability Physics Symposium.

Timing characterizations of device and CPU-like circuit to ensure process reliability

Y.-H Lee, W. Wang, Y.-C Huang, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Wafer level test arrays with simple BIST to expedite process development for circuit reliability

Y.-H Lee, W. Wang, J. H. Lee, 2015, 2015 IEEE International Integrated Reliability Workshop (IIRW).

Frequency dependence of NBTI in high-k/metal-gate technology

K. Wu, Y.-H Lee, W. Wang, 2014, 2014 IEEE International Reliability Physics Symposium.

Re-investigation of frequency dependence of PBTI/TDDB and its impact on fast switching logic circuits

W. Wang, J. R. Shih, Y.-C Huang, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).