Masanari Koguchi

High-precision edge-roughness measurement of transistor gates using three-dimensional electron microscopy combined with marker-assisted image alignment

Yuzuru Ohji, Shiano Ono, Miyuki Yamane, 2011, Advanced Lithography.

Growth and optical properties of nanometer‐scale GaAs and InAs whiskers

Kenji Hiruma, Masamitsu Yazawa, Kensuke Ogawa, 1995 .

Effect of one monolayer of surface gold atoms on the epitaxial growth of InAs nanowhiskers

Kenji Hiruma, Masamitsu Yazawa, Atsushi Muto, 1992 .