M. Yao

Demonstration of a 4 Mb, high density ferroelectric memory embedded within a 130 nm, 5 LM Cu/FSG logic process

J. Rodriguez, K. Remack, K. Boku, 2002, Digest. International Electron Devices Meeting,.

A manufacturable 0.30 /spl mu/m gate CMOS technology for high speed microprocessors

D. Spratt, S. Crank, M. Yao, 1996, 1996 Symposium on VLSI Technology. Digest of Technical Papers.

On line measuring method for mould friction in continuous casting

M. Yao, D. C. Fang, 1996 .