L. Boisvert

Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

Claude Thibeault, Luc Boisvert, C. Thibeault, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results

Claude Thibeault, Luc Boisvert, C. Thibeault, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).