K.L.M. van der Klauw

Self-multiplexing force-sense test structures for (MOS) IC applications

K.L.M. van der Klauw, J.J.M. Joosten, L.A. Wall, 1990, International Conference on Microelectronic Test Structures.

Analysis of the determination of the dimensional offset of conducting layers and MOS transistors

K.L.M. van der Klauw, J.J.M. Joosten, S. Swaving, 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.