Rishi Bhooshan

A new full-chip verification methodology to prevent CDM oxide failures

Maxim Ershov, Rishabh Agarwal, James W. Miller, 2015, 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Faraday cage for EMC improvement of electronic devices

Sumit Varshney, Rishi Bhooshan, Shailesh Kumar, 2015, 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC).

Optimum IR drop models for estimation of metal resource requirements for power distribution network

Rishi Bhooshan, Bindu P. Rao, 2007, 2007 IFIP International Conference on Very Large Scale Integration.

Novel and Efficient IR-Drop Models for Designing Power Distribution Network for Sub-100nm Integrated Circuits

Rishi Bhooshan, 2007, 8th International Symposium on Quality Electronic Design (ISQED'07).