P. Dickinson

Transition test bring-up and diagnosis on UltraSPARCTM processors

Scott Davidson, Paul Dickinson, Liang-Chi Chen, 2011, 2011 IEEE International Test Conference.

Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family

Kevin Wu, Scott Davidson, Liang-Chi Chen, 2009, 2009 International Test Conference.

Transition Test on UltraSPARC- T2 Microprocessor

Subhra Bhattacharya, David Curwen, Liang-Chi Chen, 2008, 2008 IEEE International Test Conference.