Anne Beyreuther

IC security and quality improvement by protection of chip backside against hardware attacks

Christian Boit, Bernd Szyszka, Elham Amini, 2018, Microelectron. Reliab..

Assessment of a Chip Backside Protection

Christian Boit, Bernd Szyszka, Elham Amini, 2018, J. Hardw. Syst. Secur..

Ultra sensitive measurement of dielectric current under pulsed stress conditions

Christian Boit, Clemens Helfmeier, Anne Beyreuther, 2015, Microelectron. Reliab..

Photon emission as a characterization tool for bipolar parasitics in FinFET technology

Christian Boit, Ingrid De Wolf, T. Nakamura, 2018, Microelectron. Reliab..

Generation and Tracking of Optical Signals inside the IC to Improve Device Security and Failure Analysis

Christian Boit, Jean-Pierre Seifert, Elham Amini, 2019, 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).

New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis

Susanne Hübner, Christian Boit, K. Croes, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Second generation of optical IC-backside protection structure

Jean-Pierre Seifert, Christian Boit, Elham Amini, 2020, 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Application of the transverse resonance method for efficient extraction of the dispersion relation of arbitrary layers in silicon interposers

Klaus-Dieter Lang, Ivan Ndip, Xiaomin Duan, 2013, 2013 17th IEEE Workshop on Signal and Power Integrity.

Contactless visible light probing for nanoscale ICs through 10 μm bulk silicon

Heiko Lohrke, Christian Boit, Philipp Scholz, 2015 .