Amr Osman

Characterization of process-related interfacial dielectric loss in aluminum-on-silicon by resonator microwave measurements, materials analysis, and imaging

A. F. Roudsari, J. Bylander, Marcus Rommel, 2024, 2403.00723.

Mitigation of interfacial dielectric loss in aluminum-on-silicon superconducting qubits

A. F. Roudsari, J. Bylander, A. Yurgens, 2023, 2310.06797.