G Swift

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

Chen Wei Tseng, G Allen, L D Edmonds, 2011, IEEE Transactions on Nuclear Science.

Assessing and mitigating radiation effects in Xilinx SRAM FPGAs

G Allen, G Swift, P Adell, 2008, 2008 European Conference on Radiation and Its Effects on Components and Systems.