Claus Richter

Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolution.

Gerd Häusler, Karl-Heinz Leitz, G. Häusler, 2007, Optics letters.

Deflectometry: 3D-Metrology from Nanometer to Meter

Christian Faber, Gerd Häusler, Markus C. Knauer, 2009 .