Saibal Mukhopadhyay

Design and Performance Comparison of 6-T SRAM Cell in 32nm CMOS, FinFET and CNTFET Technologies

M. Madheswaran, G. Boopathi Raja, T. P. Haraszti, 2013 .

Leakage in nanometer scale CMOS circuits

C. Neau, K. Roy, H. Mahmoodi-Meimand, 2003, 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672).