Mottaqiallah Taouil

发表

Synthesizing HDL to memristor technology: A generic framework

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2016, 2016 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH).

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level

Said Hamdioui, Mottaqiallah Taouil, Lizhou Wu, 2020, 2020 IEEE European Test Symposium (ETS).

Memory profiling for intra-application data-communication quantification: A survey

Mottaqiallah Taouil, Koen Bertels, Imran Ashraf, 2015, 2015 10th International Design & Test Symposium (IDT).

Mitigation of Sense Amplifier Degradation Using Skewed Design

Said Hamdioui, Mottaqiallah Taouil, Pieter Weckx, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories

Said Hamdioui, Mottaqiallah Taouil, 2011, 2011 Sixteenth IEEE European Test Symposium.

On resistive open defect detection in DRAMs: The charge accumulation effect

Yiorgos Tsiatouhas, Said Hamdioui, Mottaqiallah Taouil, 2015, 2015 20th IEEE European Test Symposium (ETS).

Interconnect test for 3D stacked memory-on-logic

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Memristor based computation-in-memory architecture for data-intensive applications

Henk Corporaal, Francky Catthoor, Said Hamdioui, 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

On the Implementation of Computation-in-Memory Parallel Adder

Said Hamdioui, Lei Xie, Mottaqiallah Taouil, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2012, J. Electron. Test..

Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2015, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

RNN-Based Detection of Fault Attacks on RSA

Said Hamdioui, Mottaqiallah Taouil, Troya Çagil Köylü, 2020, 2020 IEEE International Symposium on Circuits and Systems (ISCAS).

Comparative BTI analysis for various sense amplifier designs

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2016, 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

Mitigation of sense amplifier degradation using input switching

Francky Catthoor, Wim Dehaene, Said Hamdioui, 2017, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.

Public-Key Based Authentication Architecture for IoT Devices Using PUF pdf

Said Hamdioui, Mottaqiallah Taouil, Erik van der Sluis, 2019, 6th International Conference on Computer Science, Engineering and Information Technology (CSEIT-2019).

Testing Open Defects in Memristor-Based Memories

Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron, 2015, IEEE Transactions on Computers.

Electrical Modeling of STT-MRAM Defects

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2018, 2018 IEEE International Test Conference (ITC).

Comparative BTI impact for SRAM cell and sense amplifier designs

Wim Dehaene, Said Hamdioui, Mottaqiallah Taouil, 2015 .

Interconnect networks for resistive computing architectures

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2017, 2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS).

A computation-in-memory accelerator based on resistive devices

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2019, MEMSYS.

High performance and resource efficient biological sequence alignment

Zaid Al-Ars, Mottaqiallah Taouil, Laiq Hasan, 2010, 2010 Annual International Conference of the IEEE Engineering in Medicine and Biology.

Non-volatile look-up table based FPGA implementations

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2016, 2016 11th International Design & Test Symposium (IDT).

Testing Computation-in-Memory Architectures Based on Emerging Memories

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2019, 2019 IEEE International Test Conference (ITC).

Memristive devices for computing: Beyond CMOS and beyond von Neumann

Jintao Yu, Dietmar Fey, Said Hamdioui, 2017, 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC).

Stacking order impact on overall 3D die-to-wafer Stacked-IC cost

Said Hamdioui, Mottaqiallah Taouil, 2011, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems.

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Software-Based Mitigation for Memory Address Decoder Aging

Jaan Raik, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE Latin American Test Symposium (LATS).

Modeling Static Noise Margin for FinFET based SRAM PUFs

Said Hamdioui, Mottaqiallah Taouil, Roel Maes, 2020, 2020 IEEE European Test Symposium (ETS).

Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2017, 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).

Reliability Modeling and Mitigation for Embedded Memories

Said Hamdioui, Mottaqiallah Taouil, Innocent Okwudili Agbo, 2019, 2019 IEEE International Test Conference (ITC).

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier

Said Hamdioui, Mottaqiallah Taouil, Praveen Raghavan, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Performance and bandwidth optimization for biological sequence alignment

Zaid Al-Ars, Mottaqiallah Taouil, Koen Bertels, 2010, 2010 5th International Design and Test Workshop.

Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests pdf

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2020, ArXiv.

Boolean logic gate exploration for memristor crossbar

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2016, 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS).

Testing Scouting Logic-Based Computation-in-Memory Architectures

Said Hamdioui, Mottaqiallah Taouil, Rajendra Bishnoi, 2020, 2020 IEEE European Test Symposium (ETS).

Is TSV-based 3D integration suitable for inter-die memory repair?

Sorin Cotofana, Said Hamdioui, Mottaqiallah Taouil, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2014, 2014 International Test Conference.

On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2010, 2010 IEEE International Test Conference.

Testing Resistive Memories: Where are We and What is Missing?

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2018, 2018 IEEE International Test Conference (ITC).

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2015, 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Time-division Multiplexing Automata Processor

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE).

On the robustness of memristor based logic gates

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2017, 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS).

BTI analysis for high performance and low power SRAM sense amplifier designs

Said Hamdioui, Mottaqiallah Taouil, Praveen Raghavan, 2015 .

Reconfigurable sparse/dense matrix-vector multiplier

Georgi Kuzmanov, Mottaqiallah Taouil, 2009, 2009 International Conference on Field-Programmable Technology.

The TU Delft sudoku solver on FPGA

Ioannis Sourdis, Mottaqiallah Taouil, Kees van der Bok, 2009, 2009 International Conference on Field-Programmable Technology.

Yield Improvement and Test Cost Optimization for 3D Stacked ICs

Said Hamdioui, Mottaqiallah Taouil, 2011, 2011 Asian Test Symposium.

A hardware Accelerator for the OpenFOAM Sparse Matrix-Vector Product

Mottaqiallah Taouil, 2009 .

Yield and Cost Analysis or 3D Stacked ICs

Mottaqiallah Taouil, 2014 .

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2013, 2013 8th IEEE Design and Test Symposium.

A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2018, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, 2019, 2019 IEEE European Test Symposium (ETS).

Exploring test opportunities for memory and interconnects in 3D ICs

Said Hamdioui, Mottaqiallah Taouil, Mihai Lefter, 2013, 2013 8th IEEE Design and Test Symposium.

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2020, 2020 IEEE International Test Conference (ITC).

Quality versus cost analysis for 3D Stacked ICs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2014, 2014 IEEE 32nd VLSI Test Symposium (VTS).

Using 3D-COSTAR for 2.5D test cost optimization

Erik Jan Marinissen, Said Hamdioui, Sudipta Bhawmik, 2013, 2013 IEEE International 3D Systems Integration Conference (3DIC).

Computation-in-memory based parallel adder

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2015, Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15).

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2019, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Cost Modeling for 2.5D and 3D Stacked ICs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019 .

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability

Francky Catthoor, Wim Dehaene, Said Hamdioui, 2016, 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).

Impact and mitigation of SRAM read path aging

Francky Catthoor, Wim Dehaene, Said Hamdioui, 2018, Microelectron. Reliab..

Impact of mid-bond testing in 3D stacked ICs

Erik Jan Marinissen, Said Hamdioui, Sudipta Bhawmik, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

Ionizing radiation modeling in DRAM transistors

Said Hamdioui, Mottaqiallah Taouil, Moritz Fieback, 2018, 2018 IEEE 19th Latin-American Test Symposium (LATS).

Methodology for Application-Dependent Degradation Analysis of Memory Timing

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE).

BTI analysis of SRAM write driver

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2015, 2015 10th International Design & Test Symposium (IDT).

Test Cost Analysis for 3D Die-to-Wafer Stacking

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2010, 2010 19th IEEE Asian Test Symposium.

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder

Said Hamdioui, Mottaqiallah Taouil, Francky Catthoor, 2019, 2019 IEEE European Test Symposium (ETS).

Defect and Fault Modeling Framework for STT-MRAM Testing

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2021, IEEE Transactions on Emerging Topics in Computing.

Applications of Computation-In-Memory Architectures based on Memristive Devices

Luca Benini, Francky Catthoor, Shidhartha Das, 2019, 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, 2019, 2019 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH).

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2015, TODE.

Device-Aware Test: A New Test Approach Towards DPPB Level

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE International Test Conference (ITC).

The Power of Computation-in-Memory Based on Memristive Devices

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, 2020, 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC).

Fast boolean logic mapped on memristor crossbar

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2015, 2015 33rd IEEE International Conference on Computer Design (ICCD).

2015 JETTA Reviewers

Robert Wille, Yong-Bin Kim, Alexandre M. Amory, 2016, Journal of electronic testing.

Interconnect networks for memristor crossbar

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2015, Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH´15).

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2019, 2019 IEEE European Test Symposium (ETS).

Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

Wim Dehaene, Said Hamdioui, Mottaqiallah Taouil, 2019 .

LiD-CAT: A Lightweight Detector for Cache ATtacks

Martha Johanna Sepúlveda, Cezar Reinbrecht, Said Hamdioui, 2020, 2020 IEEE European Test Symposium (ETS).

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs

Fabian Vargas, Said Hamdioui, Mottaqiallah Taouil, 2018, Microelectron. Reliab..

How significant will be the test cost share for 3D die-to-wafer stacked-ICs?

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation

Said Hamdioui, Mottaqiallah Taouil, Sohaib Majzoub, 2019, J. Low Power Electron..

On modeling and optimizing cost in 3D Stacked-ICs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2011, 2011 IEEE 6th International Design and Test Workshop (IDT).

Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures

Henk Corporaal, Jintao Yu, Imran Ashraf, 2020, IEEE Transactions on Emerging Topics in Computing.

Device aging: A reliability and security concern

Abhijit Chatterjee, Francky Catthoor, Adit D. Singh, 2018, 2018 IEEE 23rd European Test Symposium (ETS).

Challenges and Solutions in Emerging Memory Testing

Paolo Prinetto, Said Hamdioui, Mottaqiallah Taouil, 2019, IEEE Transactions on Emerging Topics in Computing.

Impact of Magnetic Coupling and Density on STT-MRAM Performance

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Memory and Communication Profiling for Accelerator-Based Platforms

Imran Ashraf, Mottaqiallah Taouil, Koen Bertels, 2018, IEEE Transactions on Computers.

Memristive devices for computation-in-memory

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2018, 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2021 .

Read path degradation analysis in SRAM

Francky Catthoor, Wim Dehaene, Said Hamdioui, 2016, 2016 21th IEEE European Test Symposium (ETS).

Degradation analysis of high performance 14nm FinFET SRAM

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2018, 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier

Francky Catthoor, Said Hamdioui, Mottaqiallah Taouil, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS).

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems

Dan Alexandrescu, Heinrich Theodor Vierhaus, Zoya Dyka, 2020, 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE).

A Classification of Memory-Centric Computing

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, 2020, ACM J. Emerg. Technol. Comput. Syst..

Memristor: the enabler of computation-in-memory architecture for big-data

Said Hamdioui, Hoang Anh Du Nguyen, Lei Xie, 2015, 2015 International Conference on Memristive Systems (MEMRISYS).

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects

Said Hamdioui, Mottaqiallah Taouil, Thiago Copetti, 2020, 2020 IEEE Latin-American Test Symposium (LATS).

Parallel matrix multiplication on memristor-based computation-in-memory architecture

Jintao Yu, Said Hamdioui, Mottaqiallah Taouil, 2016, 2016 International Conference on High Performance Computing & Simulation (HPCS).

G-PUF: An Intrinsic PUF Based on GPU Error Signatures

Luigi Carro, Bruno Forlin, Cezar Reinbrecht, 2020, 2020 IEEE European Test Symposium (ETS).

Yield Improvement for 3D Wafer-to-Wafer Stacked Memories

Said Hamdioui, Mottaqiallah Taouil, 2012, J. Electron. Test..

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs)

Said Hamdioui, Mottaqiallah Taouil, Hassen Aziza, 2020, IEEE Access.

eSRAM Reliability: Why is it still not optimally solved?

Said Hamdioui, Mottaqiallah Taouil, Pieter Weckx, 2020, 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Enhancing PUF Based Challenge–Response Sets by Exploiting Various Background Noise Configurations

Giorgio Di Natale, Said Hamdioui, Mottaqiallah Taouil, 2019 .

Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era

Resve A. Saleh, Imran Ashraf, Said Hamdioui, 2019, IEEE Access.

Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, 2021, 2021 IEEE 39th VLSI Test Symposium (VTS).

Applying Thermal Side-Channel Attacks on Asymmetric Cryptography

Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation

Said Hamdioui, Mottaqiallah Taouil, Hassen Aziza, 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Power Side Channel Attacks: Where Are We Standing?

Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks

Said Hamdioui, Mottaqiallah Taouil, Troya Çagil Köylü, 2021, 2021 18th International Conference on Privacy, Security and Trust (PST).

Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State

Arnaud Virazel, Patrick Girard, Said Hamdioui, 2021, Electronics.

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs

Erik Jan Marinissen, Said Hamdioui, Mottaqiallah Taouil, 2021, IEEE Transactions on Computers.

Improving the Detection of Undefined State Faults in FinFET SRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Leticia Bolzani Poehls, 2021, 2021 IEEE European Test Symposium (ETS).

Hard-to-Detect Fault Analysis in FinFET SRAMs

Said Hamdioui, Mottaqiallah Taouil, Lizhou Wu, 2021, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

Protecting IoT Devices through a Hardware-driven Memory Verification

Said Hamdioui, Mottaqiallah Taouil, Troya Çagil Köylü, 2021, 2021 24th Euromicro Conference on Digital System Design (DSD).

APmap: An Open-Source Compiler for Automata Processors

Jintao Yu, Said Hamdioui, Hoang Anh Du Nguyen, 2022, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron

Cezar Reinbrecht, Martha Johanna Sepúlveda, Abdullah Aljuffri, 2021, 2021 24th Euromicro Conference on Digital System Design (DSD).

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects

Tiago R. Balen, Said Hamdioui, Mottaqiallah Taouil, 2021, J. Electron. Test..

GRINCH: A Cache Attack against GIFT Lightweight Cipher

Cezar Reinbrecht, Martha Johanna Sepúlveda, Abdullah Aljuffri, 2021, 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, 2021, 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

LightRoAD: Lightweight Rowhammer Attack Detector

Cezar Reinbrecht, Martha Johanna Sepúlveda, Said Hamdioui, 2021, 2021 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).

Intermittent Undefined State Fault in RRAMs

Anteneh Gebregiorgis, Said Hamdioui, Mottaqiallah Taouil, 2021, 2021 IEEE European Test Symposium (ETS).