Y. Mashiko

Reliability evaluation of thin gate oxide using a flat capacitor test structure

M. Katsumata, J. Mitsuhashi, K. Kobayashi, 1995, Proceedings International Conference on Microelectronic Test Structures.

Mechanism of electromigration in ceramic packages induced by chip-coating polyimide

M. Nunoshita, Y. Mashiko, Masanobu Kohara, 1990 .

A New VLSI Diagnosis Technique: Focused Ion Beam Assisted Multi-level Circuit Probing

H. Koyama, Y. Mashiko, T. Kaito, 1987, 25th International Reliability Physics Symposium.

Suppression of Stress Induced Aluminum Void Formation

H. Koyama, Y. Mashiko, H. Koyama, 1986, 24th International Reliability Physics Symposium.

Double stacked capacitor with self-aligned poly source/drain transistor (DSP) cell for megabit DRAM

M. Inuishi, K. Tsukamoto, Y. Akasaka, 1987, 1987 International Electron Devices Meeting.

New non-bias optical beam induced current (NB-OBIC) technique for evaluation of Al interconnects

H. Koyama, Y. Mashiko, M. Sekine, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

High resolution backside fault isolation technique using directly forming Si substrate into solid immersion lens

Y. Mashiko, J. Komori, T. Koyama, 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..