Jinyan Wang

Investigation of the Trap States and V th Instability in Normally-Off GaN MIS-FETs With LPCVD SiNx/PEALD AlN Gate Dielectric Stack and In Situ H2/N2 Plasma Pretreatment

Maojun Wang, Jiayin He, X. Wang, 2023, IEEE Transactions on Electron Devices.

Characterization of Gate Leakage and Reliability of Normally-OFF GaN MOSFET with LPCVD-SiNx/PEALD-AlN Dual Gate Dielectric and In-Situ H2(15%)/N2(85%) Plasma Pretreatment

Maojun Wang, Jianlong He, Z. Fu, 2022, Journal of Nanoelectronics and Optoelectronics.

Characterization and Reliability Analysis of Enhancement-Mode PEALD AlN/LPCVD SiNx GaN MISFET with In Situ H2/N2 Plasma Pretreatment

Bin Zhang, Chengyu Huang, Maojun Wang, 2023, Electronics.