Jin He

Investigation of the Trap States and V th Instability in Normally-Off GaN MIS-FETs With LPCVD SiNx/PEALD AlN Gate Dielectric Stack and In Situ H2/N2 Plasma Pretreatment

Maojun Wang, Jiayin He, X. Wang, 2023, IEEE Transactions on Electron Devices.

Unveiling the dynamic active site of defective carbon-based electrocatalysts for hydrogen peroxide production

Xuecheng Yan, Yanmei Shi, Shuangming Chen, 2023, Nature communications.

Characterization and Reliability Analysis of Enhancement-Mode PEALD AlN/LPCVD SiNx GaN MISFET with In Situ H2/N2 Plasma Pretreatment

Bin Zhang, Chengyu Huang, Maojun Wang, 2023, Electronics.