Daniel R. Knebel

Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits

Suhwan Kim, Keith A. Jenkins, Jean-Olivier Plouchart, 2003, IBM J. Res. Dev..

Diagnosis and characterization of timing-related defects by time-dependent light emission

Leendert M. Huisman, Franco Motika, Moyra K. McManus, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

A Multi-Mode Power Gating Structure for Low-Voltage Deep-Submicron CMOS ICs

Suhwan Kim, Marios C. Papaefthymiou, Kevin G. Stawiasz, 2007, IEEE Transactions on Circuits and Systems II: Express Briefs.

Experimental measurement of a novel power gating structure with intermediate power saving mode

Suhwan Kim, Kevin G. Stawiasz, Stephen V. Kosonocky, 2004, Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758).

Understanding and minimizing ground bounce during mode transition of power gating structures

Suhwan Kim, Stephen V. Kosonocky, Daniel R. Knebel, 2003, ISLPED '03.

Low-power circuits and technology for wireless digital systems

Suhwan Kim, Wei Hwang, Victor V. Zyuban, 2003, IBM J. Res. Dev..

S/390 G5 CMOS microprocessor diagnostics

Peilin Song, Franco Motika, Mary P. Kusko, 1999, IBM J. Res. Dev..

Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor

Franco Motika, Peilin Song, Mary P. Kusko, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Design guidelines for short, medium, and long on-chip interconnections

Keith A. Jenkins, Paul W. Coteus, Gerard V. Kopcsay, 1996 .

Circuit design techniques for the high-performance CMOS IBM S/390 Parallel Enterprise Server G4 microprocessor

Ching-Te Chuang, William V. Huott, James D. Warnock, 1997, IBM J. Res. Dev..

Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis

Pia Sanda, Moyra K. McManus, Daniel R. Knebel, 2000, Proceedings of the Ninth Asian Test Symposium.

The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)

Pia Sanda, William V. Huott, Yuen H. Chan, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

PICA: Backside failure analysis of CMOS circuits using Picosecond Imaging Circuit Analysis

William V. Huott, Jeffrey A. Kash, Daniel R. Knebel, 2000 .