V. O'Donovan

Hot carrier reliability of lateral DMOS transistors

V. O'Donovan, S. Whiston, A. Deignan, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Investigation of High-Voltage MOSFET Reliability in $I_{\rm KIRK}$ Region

V. O'Donovan, A. Deignan, K. Moloney, 2007, IEEE Transactions on Device and Materials Reliability.