Deok-kee Kim

A Compact eFUSE Programmable Array Memory for SOI CMOS

Xiang Chen, T. Kirihata, J. Safran, 2007, 2007 IEEE Symposium on VLSI Circuits.

Reliability Qualification of CoSi2 Electrical Fuse for 90Nm Technology

S.S. Iyer, J. Safran, N. Robson, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.