F. Anstotz

Electromagnetically compatible CMOS auto-balanced current sensor for highly integrated power control System-On-Chip

Philippe Poure, Vincent Frick, L. Hébrard, 2007 .

Design and prototyping of a CMOS standard contactless current measurement macrocell for integrated microsystems in power control applications

Philippe Poure, F. Braun, Luc Hebrard, 2002, 9th International Conference on Electronics, Circuits and Systems.

Challenges in the areal measurement of surface roughness and shape at the micro and nanoscale

Bruno Serio, Pierre Pfeiffer, F. Anstotz, 2014 .

Real time surface morphology analysis of semiconductor materials and devices using 4D interference microscopy

Renaud Kiefer, Paul Montgomery, F. Anstotz, 2008 .

CMOS microsystem for AC current measurement with galvanic isolation

Philippe Poure, Vincent Frick, F. Braun, 2002 .

CMOS microsystem for AC current measurement with galvanic isolation

Philippe Poure, F. Braun, Luc Hebrard, 2002, Proceedings of IEEE Sensors.

High spatial resolution silicon read-out system for single photon X-ray detection

Peter Weilhammer, Einar Nygard, Yann Hu, 1994 .

Wide field nanometric materials analysis by diffraction limited far field optical nanoscopy

Bruno Serio, D. Montaner, F. Anstotz, 2012 .

Towards real time 3D quantitative characterisation of in situ layer growth using white light interference microscopy

D. Montaner, F. Anstotz, Paul Montgomery, 2010 .