Shenghou Liu

High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure

Yilong Hao, Yangyuan Wang, Jinyan Wang, 2012, Microelectron. Reliab..

Trapping mechanisms in insulated‐gate GaN power devices: Understanding and characterization techniques

Shu Yang, Kevin J. Chen, Shenghou Liu, 2017 .

Multiple Ti/Al stacks induced thermal stability enhancement in Ti/Al/Ni/Au Ohmic contact on AlGaN/GaN heterostructure

Yilong Hao, Zhihua Dong, Yangyuan Wang, 2010, 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.

Mechanisms of thermally induced threshold voltage instability in GaN-based heterojunction transistors

Shu Yang, Cheng Liu, Kevin J. Chen, 2014 .

Toward reliable MIS‐ and MOS‐gate structures for GaN lateral power devices

Shu Yang, Kevin J. Chen, Shenghou Liu, 2016 .

Analysis of surface roughness in Ti/Al/Ni/Au Ohmic contact to AlGaN/GaN high electron mobility transistors

Baoshun Zhang, Min Yu, Zhihua Dong, 2010 .

Analysis on the new mechanisms of low resistance stacked Ti/Al Ohmic contact structure on AlGaN/GaN HEMTs

Yilong Hao, Baoshun Zhang, Min Yu, 2010 .