J. Koeter

Designing IEEE 1149.1 compatible boundary-scan logic into an ASIC using Texas Instrument's Scope architecture

J. Koeter, 1990, Third Annual IEEE Proceedings on ASIC Seminar and Exhibit.

Interconnect testing using BIST embedded in IEEE 1149.1 designs

J. Koeter, S. Sparks, 1991, [1991] Proceedings Fourth Annual IEEE International ASIC Conference and Exhibit.