T. Phan

Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer

S. Dilhaire, W. Claeys, E. Schaub, 1998 .

Thermomechanical and electromigration studies with a high sensitive and high resolution laser probe

S. Dilhaire, W. Claeys, E. Schaub, 1997, Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Modelling and experimental study of heat deposition and transport in a semiconductor laser diode

V. Quintard, S. Dilhaire, W. Claeys, 1998 .

High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics

S. Dilhaire, W. Claeys, E. Schaub, 1997 .