G. Ghibaudo
发表
G. Ghibaudo,
F. Balestra,
K. Tsukagoshi,
2013,
IEEE Electron Device Letters.
Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET
A. Asenov,
G. Ghibaudo,
B. Cheng,
2008,
IEEE Electron Device Letters.
G. Ghibaudo,
G. Pananakakis,
R. Clerc,
2007,
IEEE Transactions on Electron Devices.