L. Moczko

Symmetry-dependent dielectric screening of optical phonons in monolayer graphene

S. Berciaud, Etienne Lorchat, Kenji Watanabe, 2023, 2310.13868.

Large-Scale Statistical Analysis of Defect Emission in hBN: Revealing Spectral Families and Influence of Flake Morphology.

R. K. Chowdhury, A. Barsella, M. S. Islam, 2023, ACS nano.