E. San Andrés

A robust method to determine the contact resistance using the van der Pauw set up

Ignacio Mártil, David Pastor, Germán González-Díaz, 2017 .

Positive bias temperature instabilities on sub-nanometer EOT FinFETs

Guido Groeseneken, Moonju Cho, E. San Andrés, 2011, Microelectron. Reliab..

On the influence of substrate cleaning method and rapid thermal annealing conditions on the electrical characteristics of Al/SiNx/SiO2/Si fabricated by ECR-CVD

Héctor García, J. Barbolla, E. San Andrés, 2005, Microelectron. Reliab..

Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection

Guido Groeseneken, Luigi Pantisano, Robin Degraeve, 2007 .