Yasuto Hijikata

Wavelength-Division-Multiplexing in Fiber-Optic Micro-Probe Array for Ultrasonic Field Measurements

Kentaro Nakamura, Yasuto Hijikata, 2000 .

Electrical Characteristics of Interface Defects in Oxides Grown at 1200℃ in Dry Oxygen Ambient on Silicon Carbide and Their

Tetsuo Takahashi, Hajime Okumura, Hidekazu Tsuchida, 2003 .

Physics and Technology of Silicon Carbide Devices

Yasuto Hijikata, Y. Hijikata, 2012 .

Ultra-Precision Finishing of Micro Aspherical Surface by Ultrasonic Vibration Assisted Polishing

Keiichi Nakamoto, Toshimichi Moriwaki, Tadashi Okino, 2005 .

Composition analysis of SiO2/SiC interfaces by electron spectroscopic measurements using slope-shaped oxide films

Hiroyuki Yaguchi, Yasuto Hijikata, Masahito Yoshikawa, 2001 .