Ion Cristian Abraham

Nanoliter MEMS package gas sampling to determine hermeticity

James Michael Hochrein, Steven M. Thornberg, Therese A. Padilla, 2005, SPIE MOEMS-MEMS.

SiO2 to Si selectivity mechanisms in high density fluorocarbon plasma etching

Ion Cristian Abraham, R. Claude Woods, Amy E. Wendt, 1996 .