Avery Green

Characterization and Control of the Surface of the Topological Insulator Bi2Se3

Advisor, Alain C. Diebold, Avery Green, 2017 .

Optical critical dimension metrology for directed self-assembly assisted contact hole shrink

Warren Montgomery, Moshe E. Preil, Erik R. Hosler, 2016 .

Spectroscopic imaging ellipsometry for automated search of flakes of mono- and n-layers of 2D-materials

Alain C. Diebold, Avery Green, Ursula Wurstbauer, 2017 .