Wu Qingwu

Multi-Vth technique based on potential critical paths for NBTI effect and leakage tradeoff

Ding Li, Liang Huaguo, Yi Maoxiang, 2017, 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI).

Effective critical gate identification for mitigating circuit aging using gate replacement

Ding Li, Liang Huaguo, Yi Maoxiang, 2017, 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI).