R.A. Ashton
发表
R.A. Ashton,
2005,
Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..
R.A. Ashton,
R. Ashton,
2004,
Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).
E. Worley,
R.A. Ashton,
2006,
2006 Electrical Overstress/Electrostatic Discharge Symposium.
T. Meuse,
B.E. Weir,
R.A. Ashton,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
J. Barth,
R.A. Ashton,
J. Richner,
2005,
2005 Electrical Overstress/Electrostatic Discharge Symposium.