F. Garat

Degradation mechanisms induced by thermal and bias stresses in InP HEMTs

Nathalie Labat, Nathalie Malbert, Benoit Lambert, 2002, Microelectron. Reliab..

Comparison of RF and DC life-test effects on GaAs power MESFETs

Nathalie Labat, F. Garat, Frédéric Verdier, 2000 .

Parameter identification for dynamic simulation

Christian Laugier, F. Garat, Ammar Joukhadar, 1997, Proceedings of International Conference on Robotics and Automation.

Effects of RF life-test on LF electrical parameters of GaAs power MESFETs

Y. Danto, F. Garat, Cristell Maneux, 1999 .

Beyond Ka-band: leveraging Q/V band to ensure the provision and future growth of broadband satellite communications

Jean-Christophe Angevain, R. De Gaudenzi, F. Garat, 2011 .