A. V. Ulanova

Advanced system for CMOS SOI test structures measurements

P. V. Nekrasov, A. Yu Nikiforov, I. I. Shvetsov-Shilovskiy, 2016, 2016 International Siberian Conference on Control and Communications (SIBCON).

Automated I–V measurement system for CMOS SOI transistor test structures

P. V. Nekrasov, A. V. Sogoyan, I. I. Shvetsov-Shilovskiy, 2015, 2015 International Siberian Conference on Control and Communications (SIBCON).

Hardness assurance levels and requirements for single event effects testing of integrated circuits

Dmitry V. Boychenko, A. V. Sogoyan, Alexander I. Chumakov, 2020 .

Automatic control system for memory chips performance in a radiation experiment

A. V. Ulanova, A. Y. Nikiforov, A. A. Orlov, 2015, 2015 International Siberian Conference on Control and Communications (SIBCON).

Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

A. Y. Nikiforov, I. I. Shvetsov-Shilovskiy, A. V. Ulanova, 2017, 2017 International Siberian Conference on Control and Communications (SIBCON).