C.J. Marshall

Recent radiation damage and single event effect results for microelectronics

P.W. Marshall, C.M. Seidleck, M.V. O'Bryan, 1999, 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463).

Current single event effects and radiation damage results for candidate spacecraft electronics

H.S. Kim, P.W. Marshall, C.M. Seidleck, 2002, IEEE Radiation Effects Data Workshop.