B. A. Unger

Electrostatic Discharge Failures of Semiconductor Devices

B. A. Unger, 1981, 19th International Reliability Physics Symposium.

The spacecraft structure and thermal design considerations

P. Hrycak, J. W. Stafford, B. A. Unger, 1963 .

A method for rapid testing of beam crossover circuits

B. A. Unger, Dave Hightower, Dave Hightower, 1972, Design Automation Conference.

Laser machining of thin films and integrated circuits

B. A. Unger, M. I. Cohen, J. F. Milkosky, 1968 .

Degradation in InGaAsP semiconductor lasers resulting from human body model ESD

B. A. Unger, L. F. DeChairo, 1993 .

ELECTROSTATIC DISCHARGE FAILURESOF SEMICONDUCTORDEVICES

B. A. Unger, 1981 .

Laser‐Machining Thin‐Film Electrode Arrays on Quartz Crystal Substrates

B. A. Unger, J. L. Hokanson, 1969 .

Semiconductor device reliability

B. A. Unger, A. Christou, 1989 .