Xiankun Jin

An on-chip ADC BIST solution and the BIST enabled calibration scheme

Degang Chen, Randall L. Geiger, David Kramer, 2017, 2017 IEEE International Test Conference (ITC).

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test

Randall L. Geiger, Degang Chen, Tao Chen, 2018, IEEE Transactions on Circuits and Systems I: Regular Papers.

Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test

Nan Sun, Xiankun Jin, 2014, 2014 IEEE International Symposium on Circuits and Systems (ISCAS).

Fast Gate Leakage Current Monitor With Large Dynamic Range

Degang Chen, Kushagra Bhatheja, Xiankun Jin, 2021, IEEE Transactions on Circuits and Systems II: Express Briefs.