R. Stella

Characterization and modeling of transient device behavior under CDM ESD stress

G. Groeseneken, H. Gieser, M. Etherton, 2004, 2003 Electrical Overstress/Electrostatic Discharge Symposium.

Internal behavior of BCD ESD protection devices under TLP and very-fast TLP stress

M. Blaho, L. Zullino, A. Andreini, 2004, IEEE Transactions on Device and Materials Reliability.

Novel achievements in the understanding and suppression of parasitic minority carrier currents in P/sup -/ epitaxy/P/sup ++/ substrate smart power technologies

R. Stella, G. Croce, S. Favilla, 2004, 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs.

Robust and performing RF LDMOS device integrated in a VLSI BCD silicon technology

A. Moscatelli, R. Stella, Lorenzo Labate, 2003, IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2003.