M A Breuer

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VI. Redundancy, Testing Circuits, and Codes.

M A Breuer, A J Carlan, 1982 .

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VII. Built-In Testing (BIT) and Built-In Test Equipment (BITE).

M A Breuer, Al J. Carlan, 1982 .

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume I. Executive Summary.

M A Breuer, Al J Carlan, 1982 .

State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VIII. Fault Simulation.

M A Breuer, A J Carlan, 1982 .