J. Anwer

Evaluation of circuit reliability based on distribution of different signal input patterns

V. S. Asirvadam, N. H. Hamid, N. S. S. Singh, 2012, 2012 IEEE 8th International Colloquium on Signal Processing and its Applications.

Determination of worst case input combinations of nanoscale circuits using Bayesian networks

V. S. Asirvadam, N. H. Hamid, U. Khalid, 2012, 2012 4th International Conference on Intelligent and Advanced Systems (ICIAS2012).

A Novel Error-Detection Mechanism for Digital Circuits Using Markov Random Field Modelling

V. S. Asirvadam, N. H. Hamid, U. Khalid, 2012, 2012 Fourth International Conference on Computational Intelligence and Communication Networks.

Sensitivity analysis of Probability Transfer Matrix (PTM) on same functionality circuit architectures

V. S. Asirvadam, N. H. Hamid, N. S. S. Singh, 2012, 2012 IEEE 8th International Colloquium on Signal Processing and its Applications.

Reliable area index: A novel approach to measure reliability of Markov Random Field based circuits

S. F. Shaukat, N. H. Hamid, U. Khalid, 2012, 2012 4th International Conference on Intelligent and Advanced Systems (ICIAS2012).