Dooyoung Yang

Enhanced Degradation of MOSFET's at Elevated Temperatures and Its Impact on DRAM Circuits

Hyunsang Hwang, Dooyoung Yang, 1995 .

Hot-carrier-induced circuit degradation in actual DRAM

Hyungsoon Shin, Yung-Kwon Sung, Yoonjong Huh, 1995, Proceedings of 1995 IEEE International Reliability Physics Symposium.

Analysis of circuit degradation due to hot-carrier effects in 64Mb DRAMs

Yung-Kwon Sung, Yoonjong Huh, Dooyoung Yang, 1996 .