Chunyi Huang

Towards reliability-aware circuit design in nanoscale FinFET technology: — New-generation aging model and circuit reliability simulator

Peng Hao, Yangyuan Wang, Runsheng Wang, 2017, 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).

Reliability variability simulation methodology for IC design: An EDA perspective

Ru Huang, Runsheng Wang, Shaofeng Guo, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).