T. Koyama
发表
M. McAllister,
R. Braswell,
T. Koyama,
1993
.
M. Hashizume,
T. Koyama,
T. Tamesada,
1998,
Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232).
T. Koyama,
Y. Murooka,
Y. Zhu,
1998,
ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132).