Curt A. Richter

发表

Memristors With Flexible Electronic Applications

Nadine Gergel-Hackett, Joseph L. Tedesco, Curt A. Richter, 2012, Proceedings of the IEEE.

Invited) Importance of Interface Engineering in Organic Spintronics

Jun-Sik Lee, Oana D. Jurchescu, R. Joseph Kline, 2015 .

Metrology for the Electrical Characterization of Semiconductor Nanowires

Vincent M. Stanford, Qiliang Li, Dimitris E. Ioannou, 2008, IEEE Transactions on Electron Devices.

Solution-Processed Flexible Memristors | NIST

David J. Gundlach, Curt A. Richter, Nadine Gergel-Hackett, 2009 .

Towards Low-Noise Flexible Electronics | NIST

John E. Anthony, Hao Xiong, Oana D. Jurchescu, 2009 .

Metrology Development for the Nanoelectronics Industry at the National Institute of Standards and Technology

Richard M. Silver, Curt A. Richter, J A Dagata, 2004 .

Papers Selected from the International Semiconductor Device Research Symposium 2007 ISDRS 2007 Foreword | NIST

Curt A. Richter, A. Iliadis, 2008 .

(Invited) Unexpected Molecular Interfaces: SAMs on Cobalt

Curt A. Richter, Christina A. Hacker, Sujitra J. Pookpanratana, 2015 .

Metrology to Enable "More than Moore" Applications of Resistive Switching Devices

Qiliang Li, Haitao Li, Oana D. Jurchescu, 2012 .

On-chip characterization of molecular electronic devices using CMOS: the design and simulation of a hybrid circuit based on experimental molecular electronic device results

Garrett S. Rose, Peter C. Paliwoda, Nadine Gergel-Hackett, 2007, GLSVLSI '07.

Flexible Memristors | NIST

Joseph L. Tedesco, Curt A. Richter, Nadine Gergel-Hackett, 2010 .

Gate Dielectric Metrology Review: Project FEPZ001 Year 2 Report

Curt A. Richter, Dennis M. Maher, 2000 .

A Flexible Solution-Processed Memristor | NIST

Joseph L. Tedesco, Curt A. Richter, Nadine Gergel-Hackett, 2010 .

Calibration and impact of bulk trap-assisted tunneling and Shockley-Read-Hall currents in InGaAs tunnel-FETs

Eddy Simoen, Marc Heyns, Nadine Collaert, 2017 .

High inversion current in silicon nanowire field effect transistors

Eric M. Vogel, John E. Bonevich, Sang-Mo Koo, 2004 .

Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits.

John E. Anthony, Sean Parkin, Lee J. Richter, 2008, Nature materials.

Topological Insulator Bi2Se3 Nanowire Field Effect Transistors

Curt A. Richter, Qiliang Li, Erhai Zhao, 2014 .

Self-aligned multi-channel silicon nanowire field-effect transistors

Dimitris E. Ioannou, Hao Zhu, Helmut Baumgart, 2011 .

Determination of graphene work function and graphene-insulator-semiconductor band alignment by internal photoemission spectroscopy

Huili Grace Xing, Qin Zhang, Tian Shen, 2012 .

Silicon nanowires as enhancement-mode Schottky barrier field-effect transistors

Eric M. Vogel, Sang-Mo Koo, Curt A. Richter, 2005 .

Characterization of electrically active defects in high-k gate dielectrics by using low frequency noise and charge pumping measurements

Gennadi Bersuker, John S. Suehle, Yoram Shapira, 2007 .

Silicon nanowire electromechanical switches for logic device application

John S. Suehle, Sang-Mo Koo, Curt A. Richter, 2007 .

Influence of buffer layer thickness on memory effects of SrBi2Ta2O9/SiN/Si structures

Eric M. Vogel, Sang-Mo Koo, Curt A. Richter, 2004 .

Calibration of the Effective Tunneling Bandgap in GaAsSb/InGaAs for Improved TFET Performance Prediction

Nadine Collaert, Anda Mocuta, Anne S. Verhulst, 2016, IEEE Transactions on Electron Devices.

Characterization and production metrology of gate dielectric films

Alain C. Diebold, C. E. Weintraub, Curt A. Richter, 2001 .

Topological Insulator Bi2Se3 Nanowire High Performance Field-Effect Transistors

Dimitris E. Ioannou, John E. Bonevich, Hao Zhu, 2013, Scientific Reports.

Neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry characterization of thin SiO2 on Si

Charles F. Majkrzak, Curt A. Richter, Nhan V. Nguyen, 1998 .

Redox-Active Molecular Nanowire Flash Memory for High-Endurance and High-Density Nonvolatile Memory Applications.

John S. Suehle, John E. Bonevich, Hao Zhu, 2015, ACS applied materials & interfaces.

Insights into the characterization of polymer-based organic thin-film transistors using capacitance-voltage analysis

John S. Suehle, Curt A. Richter, David J. Gundlach, 2008 .

Limitations of conductance to the measurement of the interface state density of MOS capacitors with tunneling gate dielectrics

Eric M. Vogel, John S. Suehle, Curt A. Richter, 2000 .

Spectroscopic ellipsometry characterization of high-k dielectric HfO2 thin films and the high-temperature annealing effects on their optical properties

Byoung Hun Lee, Curt A. Richter, Nhan V. Nguyen, 2002 .

High Performance Silicon Nanowire Field Effect Transistor

Dimitris E. Ioannou, John S. Suehle, Yang Yang, 2008 .

Low frequency noise characterizations of ZnO nanowire field effect transistors

John S. Suehle, Woong-Ki Hong, Curt A. Richter, 2007 .

Silicon nanowire on oxide/nitride/oxide for memory application

Dimitris E. Ioannou, John S. Suehle, Joseph J. Kopanski, 2007 .

Nonvolatile memory based on redox-active ruthenium molecular monolayers

Tong Ren, Curt A. Richter, Sujitra J. Pookpanratana, 2019, Applied Physics Letters.

Random telegraph signals in n-type ZnO nanowire field effect transistors at low temperature

John S. Suehle, Daniel M. Fleetwood, Woong-Ki Hong, 2007 .

Non-volatile memory with self-assembled ferrocene charge trapping layer

Dimitris E. Ioannou, Hao Zhu, Curt A. Richter, 2013 .

Ultrathin SiO2 and High-K Materials for ULSI Gate Dielectrics

G. Lucovsky, Curt A. Richter, H. R. Huff, 1999 .