A. Grossi

Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

B. DeSalvo, E. Vianello, E. Nowak, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Fundamental variability limits of filament-based RRAM

G. Cibrario, C. Zambelli, E. Nowak, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

Indicators and ratings for the compatibility assessment of conservation actions

J. Delgado Rodrigues, A. Grossi, J. Rodrigues, 2007 .

About the intrinsic resistance variability in HfO2-based RRAM devices

G. Reimbold, C. Zambelli, E. Vianello, 2017, 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).